Trabalho em evento · 2010

Effect on the insulation material of a MOSFET device submitted to a standard diagnostic radiation beam

C M S de Magalhães; L A P dos Santos; D do N Souza; A F Maia

Metadados

DOI: 10.1088/1742-6596/249/1/012032
Veículo: Journal of Physics: Conference Series
Ano: 2010
Tipo: Trabalho em evento
Texto completo: http://www.scopus.com/inward/record.url?eid=2-s2.0-78651108789&partnerID=MN8TOARS
Fonte do metadado: orcid, crossref

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BibTeX

@misc{magalhaes2010effect,
  title   = {Effect on the insulation material of a MOSFET device submitted to a standard diagnostic radiation beam},
  author  = {C M S de Magalhães and L A P dos Santos and D do N Souza and A F Maia},
  year    = {2010},
  journal = {Journal of Physics: Conference Series},
  doi     = {10.1088/1742-6596/249/1/012032},
  url     = {http://www.scopus.com/inward/record.url?eid=2-s2.0-78651108789&partnerID=MN8TOARS},
}

RIS (EndNote, Mendeley, Zotero)

TY  - GEN
AU  - C M S de Magalhães
AU  - L A P dos Santos
AU  - D do N Souza
AU  - A F Maia
TI  - Effect on the insulation material of a MOSFET device submitted to a standard diagnostic radiation beam
PY  - 2010
JO  - Journal of Physics: Conference Series
DO  - 10.1088/1742-6596/249/1/012032
UR  - http://www.scopus.com/inward/record.url?eid=2-s2.0-78651108789&partnerID=MN8TOARS
ER  -